Looking good.  FWIW, when I load a processor on the RT-IHU, the current goes up by 50-100ma (at a bit over 5 volts).  As soon as the program is loaded and starts, the current drops again.

73,

Burns Fisher, WB1FJ
AMSAT(R) Engineering -- Flight Software


On Tue, Dec 26, 2023 at 9:02 PM Bob Stricklin via pacsat-dev <pacsat-dev@amsat.org> wrote:
All,

I have worked on the board a few hours over the past few days.

I got the JTAG interface put together and set this up for testing with the PC and a XDS110. When I connected them together and powered things up I initially saw the LEDs on the PCB come on which is what I expect. Unfortunately when I started trying to communicate with using the JTAG I so the LEDs go off and immediatly I checked the 3.3V supply and found it was bouncing up to about 4 volts. Not good. So I powered down and after some thought I decided the 3.3 voltage regulator was not stable enough to support out board. It's working in a feed back mode trying to hold the 3.3V while adjusting Pulse Width Modulation of the LC circuit.

I tested the board with an external 3.3V supply and noticed the current draw had increased to about 240 mA. Concerning.

I have removed the MAX regulator and put a LDO fixed 3.3V regulator on hanging in the air. #.3V supply now seems solid.

I got everything reconnected to JTAG and started again trying to test. When I tried Test Connection I was seeing a message about missing a file which I later realized was the HalCoGen file defining the board info. I then tried the one from the PAcSat project that I had but this was not working either. So I used the setup system to create a basic interface with a 4 wire JTAG. The I select Test Connection and this time it seems to be working. Still more work needed to learn what it is telling be but the two successes at the bottom of the listing below are encouraging.

In this mode the supply current is down to 190 mA feeding into the 5V supply which feeds everything on the board. May be believable.

Now time to create a proper HalCoGen file.


Bob N5BRG


[Start: Texas Instruments XDS110 USB Debug Probe]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

/home/bob/.ti/ccs1250/0/0/BrdDat/testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'libjioxds110.so'.
The library build date was 'Sep  6 2023'.
The library build time was '09:54:42'.
The library package version is '9.13.0.00201'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.                                  Note: This is a key indicator

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.               Note: We are not using some of these signals so this is OK.  Bob
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.                                         Note: Good news

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.                                        Note: Good news

The JTAG DR Integrity scan-test has succeeded.

-----[An error has occurred and this utility has aborted]--------------------

This error is generated by TI's USCIF driver or utilities.

The value is '-382' (0xfffffe82).
The title is 'SC_ERR_LIST_SUBPATH_DELETE'.

The explanation is:
An error occurred when deleting a sub-path from the sub-path select list.
The sub-path may already be off the list.
Thus it cannot be deleted from that list.

[End: Texas Instruments XDS110 USB Debug Probe]

[Start: Texas Instruments XDS110 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

/home/bob/.ti/ccs1250/0/0/BrdDat/testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'libjioxds110.so'.
The library build date was 'Sep  6 2023'.
The library build time was '09:54:42'.
The library package version is '9.13.0.00201'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS110 USB Debug Probe_0]


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